— 1 GHz Bandwidth and 200 Mpts Long Memory for the Growing Demands of High-Speed Design Measurement

[New Taipei City, Taiwan – November 2025] – Good Will Instrument Co., Ltd. (GW Instek), a leading manufacturer of electronic test and measurement equipment, has announced two new high-end additions to its GDS-3000A oscilloscope family – the GDS-3102A (2-channel) and GDS-3104A (4-channel) 1 GHz Digital Storage Oscilloscopes.

Built around 1 GHz bandwidth, 5 GSa/s real-time sampling and 200 Mpts memory depth per channel, the new models are aimed at high-speed digital circuitry, power electronics design and educational laboratories, offering engineers a single test platform that combines performance with a compelling price–performance ratio.

 

 

1 GHz bandwidth with optional 1.5 GHz probe – ready for mainstream high-speed signals
The GDS-3102A / GDS-3104A raise the GDS-3000A series bandwidth ceiling from 650 MHz to 1 GHz bandwidth (50 Ω input). In 1 MΩ input mode, they still provide up to 500 MHz bandwidth and a 350 ps (calculated) rise time, addressing measurement needs such as high-speed digital interfaces and advanced power analysis.

When combined with the optional GTP-1501R 1.5 GHz 10:1 passive probe and configured for 50 Ω input, overall system bandwidth can be boosted from the approximately 447.2 MHz typical of a conventional “1 GHz oscilloscope + 500 MHz probe” pairing to around 832 MHz effective system bandwidth.

 

 

 

200 Mpts per channel for extended transient capture; high-speed 200,000 wfm/s waveform capture for elusive event detection

The GDS-3102A / GDS-3104A retain a defining advantage of the GDS-3000A platform – 200 Mpts of independent memory per channel, putting them among the leaders in their bandwidth class.

Long memory delivers clear benefits in daily use:

• Even at slower time-base settings, the oscilloscope can maintain a high sampling rate, avoiding waveform distortion or information loss caused by under-sampling.
• It enables in-depth observation and replay of long-term system behaviour, such as intermittent jitter, sporadic interference and start-up anomalies.

 

With a maximum waveform update rate of 200,000 wfm/s, the instruments can scan a very large number of trigger events in a short period of time, dramatically improving the probability of capturing rare anomalies such as glitches, spikes/surges and intermittent pulse dropouts, and helping to shorten development and debugging cycles.

 

Up to 490,000 segments of segmented memory with Mask test – faster fault isolation

The GDS-3102A / GDS-3104A support up to 490,000 segments of segmented memory. By configuring appropriate trigger conditions, the instrument can automatically skip long periods where the waveform does not change, and only write segments with actual activity into memory at high speed:

• Improving memory utilisation by avoiding storage of large volumes of repetitive waveforms
• Focusing quickly on event trigger points and abnormal behaviours

In segmented memory mode, the Mask test function can be applied to perform automatic pass/fail assessment on large numbers of captured waveforms and rapidly flag any traces, and their corresponding time positions, that fall outside the defined limits. This is well suited to production sampling, stress testing and long-term stability verification.

 

High-resolution acquisition, 38 automatic measurements and enhanced readability

To balance noise suppression with measurement precision, the GDS-3102A / GDS-3104A provide:

• High-resolution acquisition mode (Hi-Res, up to 12-bit equivalent) – using oversampling and digital filtering to effectively reduce waveform noise and make fine ripple and subtle voltage changes more visible.
• 38 automatic measurement parameters – covering voltage, time, frequency, duty cycle, pulse count, jitter and phase, meeting requirements that range from general R&D through to stringent power-performance verification.

Used together with Cursor Mark and the Indicator display region, engineers can clearly highlight the measurement window and extract key values such as ΔV and ΔT, improving both analysis efficiency and reporting.

 

Dual-channel 2.5 GHz spectrum analysis and spectrogram – time and frequency domains in a single platform

For frequency-domain work, the GDS-3102A / GDS-3104A integrate a dual-channel Spectrum Analyser and Spectrogram function, enabling:

• Spectral comparison and analysis across two channels simultaneously (for example left/right channels, input/output, or different stages of a circuit)
• Observation of the relationship between spectral intensity and time, making it easier to identify interference sources and modulation behaviour.

 

With a frequency range up to 2.5 GHz (based on advanced FFT techniques), the instruments support a variety of low-frequency RF applications, including:

• Remote controls, NFC and RFID modules
• EMI pre-compliance checks and noise distribution analysis

For engineers who need both time-domain and frequency-domain views, the GDS-3102A / GDS-3104A effectively act as a hybrid measurement platform combining an oscilloscope and dual-channel spectrum analyser.

 

Comprehensive power analysis options – designed for SMPS and power electronics

With the optional DS3A-PWR power analysis software(free try during warranty), the GDS-3102A / GDS-3104A offer a comprehensive suite of dedicated measurement functions for switch-mode power supplies (SMPS) and power electronic systems, including:

• AC input analysis: power quality, harmonics, inrush current
• DC output analysis: ripple/noise, transient response, turn on/off, efficiency
• Switching device analysis: switching loss, SOA (safe operating area), modulation analysis
• Frequency response analysis (FRA): control-loop response (gain and phase margin), PSRR
• Magnetics analysis: B-H curves for assessing core saturation and magnetic material characteristics

The instruments also provide integrated power outputs for GCP-530 (50 MHz) and GCP-1030 (100 MHz) current probes on the side panel, eliminating the need for separate current-probe power supplies. This reduces both the cost of ownership and the amount of equipment that needs to be carried, making the series a strong candidate as the primary oscilloscope for power R&D and power-electronics education.

 

Built-in dual-channel 25 MHz AWG and Bode Plot – from stimulus to measurement in one step

The GDS-3102A / GDS-3104A come as standard with a dual-channel 25 MHz Arbitrary Waveform Generator (AWG) offering a range of standard and arbitrary waveforms. Users can:

• Store waveforms acquired on the analogue channels into the AWG and re-output them as custom signals
• Simulate sensor outputs, load variations or interference signals to reproduce real-world operating scenarios

 

Together with the built-in Frequency Response Analyser (Bode Plot) function, engineers can complete on a single instrument:

• RLC circuit design and response analysis
• Filter design verification
• Amplifier frequency response and phase-margin evaluation

This allows the oscilloscope to evolve from a purely passive observer into an integrated platform for active excitation and loop analysis.

 

MSO logic analysis, serial bus decoding and multiple interfaces for modern embedded systems

By adding the optional DS3A-16LA 16-channel logic analyser module, the GDS-3102A / GDS-3104A can be upgraded to Mixed-Signal Oscilloscopes (MSO) capable of observing analogue and digital signals side by side.

Built-in serial-bus trigger and decode capabilities include:

• I²C / SPI / UART / CAN / LIN

These are complemented by:

• USB Host / Device, LAN, RS-232 and VGA output
• Optional GPIB interface (factory-installed)
• Go/NoGo BNC output

With an integrated web server for remote control, OpenWave PC software and LabVIEW drivers, the instruments can be incorporated with ease into existing test systems, whether in R&D laboratories, production test lines or teaching environments.

 

Target applications

• High-speed digital and embedded-system development
• Switch-mode power supply / power-electronics design and production testing
• General electronic circuit R&D and quality-assurance measurement
• University and technical-college laboratories in electronics, electrical engineering and power engineering

The GDS-3102A / GDS-3104A series deliver higher bandwidth, deeper memory and more comprehensive measurement capabilities to help engineers unlock the full potential of increasingly widespread high-speed electronic design.

 

 

 

For more details, visit [GDS-3102A & GDS-3104A 1 GHz Digital Storage Oscilloscope].

 

Contact Us:

Overseas Sales Department
Good Will Instrument Co., Ltd
No. 7-1, Jhongsing Road, Tucheng Dist.,
New Taipei City 23678, Taiwan R.O.C
Email: marketing@goodwill.com.tw